Facilities

 

Semiconductor and Nanostructures Epitaxy:

 

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MBE-SVTA
MBE-PE425A.jpg CVD.jpg
 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 


Materials/Devices Characterization and Processing:

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2. LCR Meter (Agilent 4284A)

 
LCR
 

 

 

 

 

 


 

 

 

 

 

 

4. Photoluminescence and

   Electroluminescence

 

3. Photocurrent Spectroscopy

 
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PL-EL1.jpg
 

 

 

 

 


                       

 

 

 

 

 

 

 

Hall effect system.jpg

6. Hybond 572A Wedge wire bonder

 
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Other materials and devices characterization capability available in UCR:

1)      Analytical Microscopy User Facility, including SEM and TEM

2)      UCR Optical User Facility, including XRD, FTIR, Raman Spectroscopy, Scanning UV/VIS/IR Spectrophotometer, etc.

 

 

Device Fabrication:

 

1. UCR Clean Room

2. UCLA Nanofabrication User Facility

3. Stanford Nanofabrication Facility